Torsional resonance mode magnetic force microscopy: enabling higher lateral resolution magnetic imaging without topography-related effects.
نویسندگان
چکیده
We present experimental work that reveals the benefits of performing magnetic force microscopy measurements employing the torsional resonance mode of cantilever oscillation. This approach provides two clear advantages: the ability of performing magnetic imaging without topography-related interference and the significant lateral resolution improvement (approximately 15%). We believe that this work demonstrates a significant improvement to a versatile magnetic imaging technique widely used in academia and in industry.
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ورودعنوان ژورنال:
- Nanotechnology
دوره 24 16 شماره
صفحات -
تاریخ انتشار 2013